DECTRIS ARINA® retractable, electron-counting detector was specifically developed for 4D STEM applications. Featuring a new ASIC, it combines an extreme speed of up to 120,000 frames per second with a high dynamic range and noise-free readout, thus enabling high-quality data acquisition at the native speed of a conventional STEM measurement. Thanks to DECTRIS’ hybrid-pixel technology, ARINA can employ different sensor materials and perform optimally in the whole energy range of 30-300 keV.
DECTRIS ARINA fits the bill for a broad spectrum of 4D STEM applications with dwell times below 10 μs, from crystalline-phases and orientation mapping to ptychography - including flexible STEM images reconstruction with virtual detectors.
- Fast and sensitive: Even at a frame rate of 120 kHz, DECTRIS ARINA can count every single electron—up to 10 pA/pixel.
- Flexible: Featuring silicon (Si) or high-Z sensor materials, DECTRIS ARINA covers a wide range of energies, from 30 to 300 keV.
- Empowering: Our team of like-minded scientists and engineers is here to help you get the most out of your setup.
Detector Specifications*
Number of pixels (W x H) |
192 x 192 |
---|---|
Active area (W x H) [mm² ] |
20 x 20 |
Pixel size (W x H) [µm² ] |
100 x 100 |
Sensor material |
Silicon (Si) or high-Z |
Energy range [keV ] |
30 - 300 |
Frame rate (max.) [Hz ] |
120,000 |
Count rate (max.) [el/s/pixel ] |
108 |
Detective Quantum Efficiency, DQE(0) |
Silicon (Si): 0.78 at 100 kV, 0.67 at 200 kV | high-Z: 0.70 at 200 kV, 0.75 at 300 kV |
Detector mounting |
Retractable |
*All specifications are subject to change without notice.
All technical documentation is available here.
Key Contact
Techniques
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)
Collect 4D STEM data of the highest possible quality with our precise and reliable electron-counting detectors.
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