Well established in X-ray detection, hybrid-pixel technology carries a lot of promise for electron microscopy. Combining the state-of-the-art pixel and ASIC design, hybrid-pixel direct detectors count individuals electrons at high speed offering a high dynamic range, zero readout noise, the utmost signal-to-noise ratio, with the added advantages of radiation hardness and an elevated frame rate. Join our talk at MC Vienna 2021 to learn more about this technology, its applications, and how it can improve data collection on TEM/STEM.
On the agenda: