DECTRIS at the Denver X-ray Conference (DXC) 2024

We are excited to meet you in Colorado, USA for the Denver X-ray Conference : DXC 2024

Meet Us 
Say hi to our Senior X-ray Analytics Product Manager, Dr. Marcus Müller.

2D Detector Workshop - Tuesday, 6. August, 13.30 - 16.30
Two-dimensional diffraction data contain abundant information about the atomic arrangement, microstructure, and defects of a solid or liquid material. In recent years, the use of two-dimensional detectors has dramatically increased in academic, government and industrial laboratories. This workshop covers recent progress in two-dimensional X-ray diffraction in terms of detector technology, geometry and configuration of the two-dimensional diffractometer. Various applications such as phase ID, texture, stress, crystallinity, combinational screening and thin film analysis will be discussed.

Organizers & Instructors:
Tom Blanton, ICDD, USA
Bob He, Bruker AXS Inc., USA
Joe Ferrara, Rigaku, USA
Marcus Mueller, DECTRIS Ltd., Switzerland
Scott Speakman, Malvern Panalytical, USA